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The interfacial properties of MgCl.sub.2./sub. thin films grown on Ti(001)
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SYSNO ASEP 0354580 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title The interfacial properties of MgCl2 thin films grown on Ti(001) Author(s) Karakalos, S. (GR)
Siokou, A. (GR)
Sutara, F. (IT)
Skála, T. (IT)
Vitaliy, F. (IT)
Ladas, S. (GR)
Prince, K. (IT)
Matolin, V. (CZ)
Cháb, Vladimír (FZU-D) RID, ORCIDSource Title Journal of Chemical Physics. - : AIP Publishing - ISSN 0021-9606
Roč. 133, č. 7 (2010), 074701/1-074701/11Number of pages 11 s. Language eng - English Country US - United States Keywords silicon, ; photoemission ; thin films Subject RIV BM - Solid Matter Physics ; Magnetism CEZ AV0Z10100521 - FZU-D (2005-2011) UT WOS 000281154200032 DOI 10.1063/1.3473933 Annotation Photoelectron spectroscopy with synchrotron radiation (SRPES), temperature programmed desorption (TPD), low energy electron diffraction (LEED), and ion-scattering spectroscopy (ISS) were used in order to study the MgCl.2/Ti(0001) interface. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2011
Number of the records: 1