Number of the records: 1  

Investigation of the mechanical properties of thin films by bulge test

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    SYSNO ASEP0353858
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JOstatní články
    TitleInvestigation of the mechanical properties of thin films by bulge test
    Author(s) Hémel, A. (FR)
    Jacques, A. (FR)
    Schenk, T. (FR)
    Kruml, Tomáš (UFM-A) RID, ORCID
    Number of authors4
    Source TitleSolid State Phenomena - ISSN 1012-0394
    156-158, - (2010), s. 477-482
    Number of pages6 s.
    ActionGADEST 2009
    Event date26.09.2009-2.10.2009
    VEvent locationBerlin
    CountryDE - Germany
    Event typeWRD
    Languageeng - English
    CountryCH - Switzerland
    Keywordsthin films ; mechanical properties ; bulge test
    Subject RIVJJ - Other Materials
    CEZAV0Z20410507 - UFM-A (2005-2011)
    AnnotationA new bulge test device has been built, with the aim to perform mechanical tests on membranes with a thickness in the 100 nm to 10 µm range, between room temperature and 900°C. The first tests on Si3N4 and gold films give results consistent with literature data.
    WorkplaceInstitute of Physics of Materials
    ContactYvonna Šrámková, sramkova@ipm.cz, Tel.: 532 290 485
    Year of Publishing2011
Number of the records: 1  

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