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Application of FIB technique to study of early fatigue damage in polycrystals
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SYSNO ASEP 0353531 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Application of FIB technique to study of early fatigue damage in polycrystals Author(s) Man, Jiří (UFM-A) RID, ORCID
Weidner, A. (DE)
Kuběna, Ivo (UFM-A) RID, ORCID
Vystavěl, T. (CZ)
Skrotzki, W. (DE)
Polák, Jaroslav (UFM-A) RID, ORCIDNumber of authors 6 Source Title Journal of Physics: Conference Series. - : Institute of Physics Publishing - ISSN 1742-6588
Roč. 240, - (2010), 012058Number of pages 4 s. Action ICSMA-15 (15th International Conference on the Strength of Materials) Event date 16.08.2009-21.08.2009 VEvent location Dresden Country DE - Germany Event type WRD Language eng - English Country GB - United Kingdom Keywords focused ion beam (FIB) ; persistent slip band (PSB) ; fatigue crack initiation Subject RIV JL - Materials Fatigue, Friction Mechanics R&D Projects 1QS200410502 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) GA101/07/1500 GA ČR - Czech Science Foundation (CSF) GA106/06/1096 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z20410507 - UFM-A (2005-2011) UT WOS 000286515800058 DOI 10.1088/1742-6596/240/1/012058 Annotation Focused ion beam (FIB) technique together with other advanced microscopic techniques were applied to study early microstructural changes leading to crack initiation in fatigued polycrystals. Dislocation structures of persistent slip bands (PSBs) and surrounding matrix were revealed in the bulk of surface grains by electron channelling contrast imaging (ECCI) technique on the FIB cross-sections. True shape of extrusions, intrusions and the path of initiated fatigue cracks were assessed in three dimensions by serial FIB cross-sectioning (FIB tomography). Advantageous potential of FIB technique and its other possible utilization in fatigue crack initiation studies in polycrystals are highlighted. Workplace Institute of Physics of Materials Contact Yvonna Šrámková, sramkova@ipm.cz, Tel.: 532 290 485 Year of Publishing 2011
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