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Probing structure and microstructure of epitaxial Ni–Mn–Ga films by reciprocal space mapping and pole figure measurements
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SYSNO ASEP 0353131 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Probing structure and microstructure of epitaxial Ni–Mn–Ga films by reciprocal space mapping and pole figure measurements Author(s) Ge, Y. (FI)
Heczko, Oleg (FZU-D) RID, ORCID
Hannula, S.-P. (FI)
Fähler, S. (DE)Source Title Acta Materialia. - : Elsevier - ISSN 1359-6454
Roč. 58, č. 20 (2010), 6665-6671Number of pages 7 s. Language eng - English Country GB - United Kingdom Keywords reciprocal space mapping ; thin film ; Ni–Mn–Ga ; martensite ; magnetic shape memory Subject RIV BM - Solid Matter Physics ; Magnetism CEZ AV0Z10100520 - FZU-D (2005-2011) UT WOS 000284446500012 DOI 10.1016/j.actamat.2010.08.029 Annotation The crystal structure and complex twinning microstructure of epitaxial Ni–Mn–Ga films on (1 0 0) MgO substrates was studied by X-ray diffraction using 2θ scans, pole figure measurements and reciprocal space mapping (RSM). Above the martensitic transformation temperature the film consists of single austenite phase with lattice constant a = 5.81A at 419 K. At room temperature some epitaxially grown residual austenite with a = 5.79A remains at the interface with the substrate, followed by an intermediate layer exhibiting orthorhombic distortion, atrans = 6.05A, btrans = 5.87A, ctrans = 5.73A and a major fraction of 14M (7M) martensite, a = 6.16A, b = 5.79A, c = 5.48A. The seven-layered modulation of this metastable martensite structure is directly observed by RSM. The intermediate phase observed close to interface indicates the existence of an instable, pre-adaptive martensite phase with a short stacking period. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2011
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