Number of the records: 1

Accurate and Easy-to-use Electron Optical Design Program for Microscopy

SYSNO ASEP	0353047
Document Type	C - Proceedings Paper (int. conf.)
R&D Document Type	Conference Paper
Title	Accurate and Easy-to-use Electron Optical Design Program for Microscopy
Author(s)	Zlámal, J. (CZ) Lencová, Bohumila (UPT-D)_{RID, SAI}
Source Title	Proceedings of the 17th IFSM International Microscopy Congress. - Rio de Janeiro : Sociedade Brasileira de Microscopia e Microanilise, 2010 - ISBN 978-85-63273-06-2
Pages	i1.6:1-2
Number of pages	2 s.
Action	International Microscopy Congress (IMC17) /17./
Event date	19.09.2010-24.09.2010
VEvent location	Rio de Janeiro
Country	BR - Brazil
Event type	WRD
Language	eng - English
Country	BR - Brazil
Keywords	EOD ; FEM ; Windows
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
R&D Projects	IAA100650805 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
CEZ	AV0Z20650511 - UPT-D (2005-2011)
Annotation	Finite Element Method (FEM) has become the universal method for computing 2D potentials in rotationally symmetric electrostatic and saturated magnetic lenses, electrostatic multipoles and magnetic deflection coils inside lenses. For all these elements optimum methods for computing the first order FEM equations were derived, fast solution algorithms implemented and an option for accuracy evaluation of lens field added. Determination of the optical properties is complemented with high accuracy ray tracing which allows extracting the aberration coefficients of up to the 5th order from the ray-traced results.
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2011

Number of the records: 1