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Interaction of short x-ray pulses with low-Z x-ray optics materials at the LCLS free-electron laser
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SYSNO ASEP 0352022 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Interaction of short x-ray pulses with low-Z x-ray optics materials at the LCLS free-electron laser Author(s) Hau-Riege, S.P. (US)
London, R.A. (US)
Graf, A. (US)
Baker, S. L. (US)
Soufli, R. (US)
Sobierajski, R. (PL)
Burian, Tomáš (FZU-D) RID, ORCID
Chalupský, Jaromír (FZU-D) RID, ORCID
Juha, Libor (FZU-D) RID, ORCID, SAI
Gaudin, J. (DE)
Krzywinski, J. (US)
Moeller, S. (US)
Messerschmidt, M. (US)
Bozek, J. (US)
Bostedt, C. (US)Source Title Optics Express. - : Optical Society of America - ISSN 1094-4087
Roč. 18, č. 23 (2010), s. 23933-23938Number of pages 8 s. Language eng - English Country US - United States Keywords x-ray optics ; optical materials ; x-ray free electron laser Subject RIV BH - Optics, Masers, Lasers R&D Projects KAN300100702 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LC528 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LA08024 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) IAAX00100903 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) ME10046 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) IAA400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) CEZ AV0Z10100523 - FZU-D (2005-2011) UT WOS 000283940900064 DOI 10.1364/OE.18.023933 Annotation Materials used for hard x-ray-free-electron laser (XFEL) optics must withstand high-intensity x-ray pulses. The advent of the Linac Coherent Light Source has enabled us to expose candidate optical materials, such as bulk B4C and SiC films, to 0.83 keV XFEL pulses with pulse energies between 1 μJ and 2 mJ to determine short-pulse hard x-ray damage thresholds. The fluence required for the onset of damage for single pulses is around the melt fluence and slightly lower for multiple pulses. We observed strong mechanical cracking in the materials, which may be due to the larger penetration depths of the hard x-rays. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2011
Number of the records: 1