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Silicate glasses doped with Ag+ ions: The comparisSilicate glasses doped with Ag+ ions: The comparison between the ion-exchange and ion implantationon between the ion-exchange and ion implantation
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SYSNO ASEP 0351924 Document Type A - Abstract R&D Document Type The record was not marked in the RIV R&D Document Type Není vybrán druh dokumentu Title Silicate glasses doped with Ag+ ions: The comparisSilicate glasses doped with Ag+ ions: The comparison between the ion-exchange and ion implantationon between the ion-exchange and ion implantation Author(s) Švecová, B. (CZ)
Nekvindová, P. (CZ)
Kormunda, M. (CZ)
Macková, Anna (UJF-V) RID, ORCID, SAI
Malinský, Petr (UJF-V) RID, ORCID, SAI
Pešička, J. (CZ)
Špirková, J. (CZ)Number of authors 7 Source Title SSC - Conference on Solid State Chemistry, Book of abstracts. - Praha, 2010 - ISBN 978-80-904678-0-4
S. 139-139Number of pages 1 s. Action SSC-Conference on Solid State Chemistry Event date 11.09.2010-15.09.2010 VEvent location Praha Country CZ - Czech Republic Event type CST Language eng - English Keywords Silicate glasses ; Silver ; Ion exchange ; Ion implantation Subject RIV BG - Nuclear, Atomic and Molecular Physics, Colliders R&D Projects GA106/09/0125 GA ČR - Czech Science Foundation (CSF) LC06041 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z10480505 - UJF-V (2005-2011) Annotation Silicate glasses containing Ag+ ions have promising optical properties for using in photonic applications. We studied properties of the Ag-doped soda lime-silicate glasses fabricated by the Ag+ ↔ Na+ ion exchange or by the Ag+ ion implantation. Concentration depth profiles of the incoming Ag+ ions were measured by various methods: Rutherford Backscattering Spectrometry, X-ray Photoelectron Spectroscopy, Secondary Ion Mass Spectrometry and Electron Microprobe Analysis. The measured data were compared to the data simulated by SRIM 2008. Waveguiding properties of fabricated samples were measured by Metricon Prism Coupler at different wavelengths. Formation of nanoparticles induced by the post-implantation annealing of the samples, done around transformation temperature of the used glasses for 5 hours, was investigated by Transmission Electron Microscope Analysis. Workplace Nuclear Physics Institute Contact Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Year of Publishing 2011
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