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Effects of Ni+ ion implantation and post annealing in PEEK, PET and PI: the morphology, the microstructure and the electric properties
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SYSNO ASEP 0351882 Document Type A - Abstract R&D Document Type The record was not marked in the RIV R&D Document Type Není vybrán druh dokumentu Title Effects of Ni+ ion implantation and post annealing in PEEK, PET and PI: the morphology, the microstructure and the electric properties Author(s) Macková, Anna (UJF-V) RID, ORCID, SAI
Malinský, Petr (UJF-V) RID, ORCID, SAI
Hnatowicz, Vladimír (UJF-V) RID
Khaibullin, R. I. (RU)
Slepička, P. (CZ)
Švorčík, V. (CZ)
Šlouf, Miroslav (UMCH-V) RID, ORCID
Peřina, Vratislav (UJF-V) RIDNumber of authors 8 Source Title 17th International conference on ion beam modification of materials, book of abstracts, P2-4-146. - 2010
Roč. 2010 (2010), s. 127-127Number of pages 1 s. Action 17th international conference on ion beam modification of materials Event date 22.08.2010-27.08.2010 VEvent location Montreal Country CA - Canada Event type WRD Language eng - English Country CA - Canada Keywords Ni ion implantation ; polymers ; depth profiles ; RBS ; TEM ; AFM Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects KAN400480701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) GA106/09/0125 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z10480505 - UJF-V (2005-2011) AV0Z40500505 - UMCH-V (2005-2011) Annotation Polyimide (PI), polyetheretherketone (PEEK) and polyethyleneterephthalate (PET) were implanted with 40 keV Ni+ ions at RT to the fluences (0.25-1.5)x1017 cm-2 at ion current density of 4 μA.cm-2. Then some of the samples were annealed at the temperatures close tothe glassy transition temperature. Depth profiles of the Ni atoms in the as implanted and annealed samples were determined by RBS method. The profiles in the as implanted samples agree well with those calculated using TRIDYN code. The implanted Ni atoms tend to aggregate into nano-particles, the size and distribution of which was determined from TEM images. The nano-particle size increases with increasing ion fluence. Subsequent annealing leads to a reduction in the nanoparticle size. The surface morphology of the implanted and annealed samples was studied using AFM. Workplace Nuclear Physics Institute Contact Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Year of Publishing 2011
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