Number of the records: 1
Self Heating of an Atomic Force Microscope
- 1.
SYSNO ASEP 0350712 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Ostatní články Title Self Heating of an Atomic Force Microscope Author(s) Kučera, Ondřej (URE-Y) RID Number of authors 1 Source Title Acta Polytechnica. - : České vysoké učení technické - ISSN 1210-2709
Roč. 20, č. 1 (2010), s. 9-11Number of pages 3 s. Language eng - English Country CZ - Czech Republic Keywords atomic force microscopy Subject RIV JB - Sensors, Measurment, Regulation CEZ AV0Z20670512 - URE-Y (2005-2011) Annotation Atomic force microscopy (AFM) is a sensitive technique susceptible to unwanted inluences, such as thermal noise, vibrational noise, etc. Although, tools that protect AFM against external noise have been developed and are widely used, there are still many sources of inherent noise. One of them is selfheating of the apparatus. This paper deals with self{heating of the AFM using an optical lever. This phenomenon is shown to be substantial in particular after activation of the microscope. The inluence on the intrinsic contact noise of AFM's is also examined. Workplace Institute of Radio Engineering and Electronics Contact Petr Vacek, vacek@ufe.cz, Tel.: 266 773 413, 266 773 438, 266 773 488 Year of Publishing 2011
Number of the records: 1