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Properties of Bi LMIS with ion clusters

SYSNO ASEP	0350670
Document Type	C - Proceedings Paper (int. conf.)
R&D Document Type	Conference Paper
Title	Properties of Bi LMIS with ion clusters
Author(s)	Radlička, Tomáš (UPT-D)_{RID, ORCID, SAI}
Number of authors	1
Source Title	Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. - Brno : Institute of Scientific Instruments AS CR, v.v.i, 2010 / Mika F. - ISBN 978-80-254-6842-5
Pages	s. 57-58
Number of pages	2 s.
Action	International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./
Event date	31.05.2010-04.06.2010
VEvent location	Skalský dvůr
Country	CZ - Czech Republic
Event type	WRD
Language	eng - English
Country	CZ - Czech Republic
Keywords	SIMS ; liquid–metal ion sources (LMIS) ; discrete coulomb interactions (DCI)
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
Next source	Framework programmes of European Commission
CEZ	AV0Z20650511 - UPT-D (2005-2011)
UT WOS	000290773700021
Annotation	The ion beams used in SIMS are produced by liquid–metal ion sources (LMIS) which provide fine, optically bright ion beams even for low emission currents around 1 .mu.A or less. The typical energy of the primary beam varies from 10 to 40 keV. The properties of the LMIS are strongly limited by the effect of the Discrete Coulomb Interactions (DCI) near the source. The DCI increase the energy width (Boersh effect) and decrease the brightness of the source due to the trajectory displacement effect. Contrary to the Ga LMIS which contains mostly only Ga+ ions, in case of the Bi LMIS the ion beam consists of several ion types and clusters of ions with similar currents. Because each ion type has different charge and mass they will be accelerated to different velocities, which increase the number of interactions and decreases the quality of the source. The aim of this contribution is a simulation of the effect of the clusters on the source properties based on the MC simulation.
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2011

Number of the records: 1