Number of the records: 1  

Optical and scanning electron microscopies in examination of ultrathin foils

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    SYSNO ASEP0350660
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleOptical and scanning electron microscopies in examination of ultrathin foils
    Author(s) Konvalina, Ivo (UPT-D) RID, ORCID, SAI
    Hovorka, Miloš (UPT-D)
    Fořt, Tomáš (UPT-D) RID, ORCID, SAI
    Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Number of authors4
    Source TitleProceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. - Brno : Institute of Scientific Instruments AS CR, v.v.i, 2010 / Mika F. - ISBN 978-80-254-6842-5
    Pagess. 23-24
    Number of pages2 s.
    ActionInternational Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./
    Event date31.05.2010-04.06.2010
    VEvent locationSkalský dvůr
    CountryCZ - Czech Republic
    Event typeWRD
    Languageeng - English
    CountryCZ - Czech Republic
    Keywordsvery low energy scanning transmission electron microscopy ; ultrathin foils ; laser confocal microscope
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    R&D ProjectsIAA100650902 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    CEZAV0Z20650511 - UPT-D (2005-2011)
    UT WOS000290773700008
    AnnotationVery low energy scanning transmission electron microscopy is emerging as a novel tool for examination of ultrathin foils to learn more about the electron structure of solids. The electron micrographs provide image contrasts governed by the effective thickness of the sample proportional to the inner potential and at lowest energies the local density of electron states in the direction of impact of the electron wave starts to dominate. The optical methods are used during the sample preparation. The laser confocal microscope Olympus Lext OLS 3100 was used for preliminary observations of the 3 nm C foil prepared by magnetron sputtering in nitrogen atmosphere on a flat glass covered by a disaccharide layer.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2011
Number of the records: 1  

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