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Influence of thickness on properties of YbxCo4Sb12 layers prepared by laser ablation

SYSNO ASEP	0350340
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Influence of thickness on properties of YbxCo4Sb12 layers prepared by laser ablation
Author(s)	Zeipl, Radek (URE-Y) Jelínek, M. (CZ) Kocourek, Tomáš (FZU-D)_{RID, ORCID, SAI} Navrátil, Jiří (UMCH-V)_RID Yatskiv, Roman (URE-Y)_{RID, ORCID} Josieková, M. (CZ) Leshkov, Sergey (URE-Y) Jurek, Karel (FZU-D)_{RID, ORCID, SAI} Walachová, Jarmila (URE-Y)
Number of authors	9
Source Title	Journal of Optoelectronics and Advanced Materials. - : NATL INST OPTOELECTRONICS - ISSN 1454-4164 Roč. 12, č. 3 (2010), s. 572-575
Number of pages	4 s.
Language	eng - English
Country	RO - Romania
Keywords	thermoelectrics ; thin layers ; skutterudites
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
R&D Projects	GA203/07/0267 GA ČR - Czech Science Foundation (CSF)
CEZ	AV0Z20670512 - URE-Y (2005-2011)
	AV0Z40500505 - UMCH-V (2005-2011)
	AV0Z10100521 - FZU-D (2005-2011)
UT WOS	000277827900031
EID SCOPUS	77950648709
Annotation	The influence of thickness on the thermoelectric properties of YbxCo4Sb12 layers prepared prepared by pulse laser deposition at substrate temperature during the deposition Ts=250 °C with energy density Ds=3 J/cm2. The thermoelectric properties such as the Seebeck coefficient, the electrical resistivity and the power factor of thin layers are presented in the temperature range from 300 K to 500 K and shoved oscillatory behavior with period of about 10 nm.
Workplace	Institute of Radio Engineering and Electronics
Contact	Petr Vacek, vacek@ufe.cz, Tel.: 266 773 413, 266 773 438, 266 773 488
Year of Publishing	2011

Number of the records: 1