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Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO.sub.2./sub. nanoparticles
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SYSNO ASEP 0349618 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO2 nanoparticles Author(s) Suzuki-Muresan, T. (FR)
Deniard, P. (FR)
Gautron, E. (FR)
Petříček, Václav (FZU-D) RID, ORCID, SAI
Jobic, S. (FR)
Grambow, B. (FR)Source Title Journal of Applied Crystallography. - : Wiley - ISSN 0021-8898
Roč. 43, Part 5 (2010), 1092-1099Number of pages 8 s. Language eng - English Country GB - United Kingdom Keywords x-ray diffraction ; Rietveld refinement ; nanoparticles Subject RIV BM - Solid Matter Physics ; Magnetism CEZ AV0Z10100521 - FZU-D (2005-2011) UT WOS 000281996600021 DOI 10.1107/S0021889810032358 Annotation Monoclinic and tetragonal zirconia samples were characterized by X-ray diffraction, pycnometry, thermogravimetric analysis (TGA), Fourier transform (FT) IR and mass (MS) spectroscopies, and scanning and transmission electron (TEM) microscopies. The results show, for the particular case of a tetragonal zirconia sample, an X-ray-undetected subproduct identified as an amorphous organic phase by FTIR–ATR (attenuated total reflection) and TGA–MS. The observations by TEM allowed this amorphous phase to be localized on the surface as a shell coating the nanoparticles. Moreover, this amorphous phase was quantified by Rietveld refinement via the addition of an internal silicon standard. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2011
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