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Characterization of sensing layer onto the tip tapered fiber
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SYSNO ASEP 0345945 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Characterization of sensing layer onto the tip tapered fiber Author(s) Pospíšilová, Marie (URE-Y)
Petrášek, Jan (UEB-Q) RID, ORCID
Matějec, Vlastimil (URE-Y)
Kašík, Ivan (URE-Y) RIDSource Title Optical Sensors 2009, 7356. - Bellingham, Washington : SPIE, 2009 / Baldini Francesco ; Homola Jiří ; Lieberman Robert - ISSN 0277-786X - ISBN 9780819476302 Pages 735624-1-735624-7 Number of pages 7 s. Action SPIE Europe Optics+Optoelectronics Event date 22.04.2009-23.04.2009 VEvent location Praha Country CZ - Czech Republic Event type EUR Language eng - English Country US - United States Keywords Tapered fibers ; fiber sensors Subject RIV JB - Sensors, Measurment, Regulation R&D Projects LC06034 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z20670512 - URE-Y (2005-2011) AV0Z50380511 - UEB-Q (2005-2011) UT WOS 000299792500057 DOI 10.1117/12.820973 Annotation In this paper we present a novel method for the measurement of the thickness of the sensing layer applied on the tip of a taper. The method is based on analysis of the distribution of the fluorescence intensity over the layer. In experiments the fl uorescence of the layer prepared by the solgel method was investigated be means of a confocal microscope Zeiss LSM5 Duo. This method has made possible to investigate sensing layers with thicknesses of about 1 um. Workplace Institute of Radio Engineering and Electronics Contact Petr Vacek, vacek@ufe.cz, Tel.: 266 773 413, 266 773 438, 266 773 488 Year of Publishing 2012
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