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Elektronová mikroskopie, mikroanalýza a difrakce na ÚMCH AV ČR
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SYSNO ASEP 0344043 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Ostatní články Title Elektronová mikroskopie, mikroanalýza a difrakce na ÚMCH AV ČR Title Electron microscopy, microanalysis and diffraction at the Institute of Macromolecular Chemistry, Academy of Sciences of the Czech republic Author(s) Šlouf, Miroslav (UMCH-V) RID, ORCID
Pavlova, Ewa (UMCH-V) RID
Králová, Daniela (UMCH-V)
Hromádková, Jiřina (UMCH-V) RID
Vlková, Helena (UMCH-V)
Lapčíková, Monika (UMCH-V) RIDSource Title Materials Structure in Chemistry, Biology, Physics and Technology. - : Czech and Slovak Crystallographic Association - ISSN 1211-5894
Roč. 17, 2a (2010), k46-k49Number of pages 4 s. Action Struktura 2010 Event date 14.06.2010-17.06.2010 VEvent location Soláň Country CZ - Czech Republic Event type EUR Language cze - Czech Country CZ - Czech Republic Keywords introduction to electron microscopy ; electron spectroscopy ; electron diffraction Subject RIV EB - Genetics ; Molecular Biology R&D Projects KAN200520704 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) GAP205/10/0348 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z40500505 - UMCH-V (2005-2011) Annotation Příspěvek popisuje použití elektronové mikroskopie, elektronové spektroskopie a elektronové difrakce pro studium mikrokrystalů a nanokrystalů. Zabývá se následujícími režimy rastrovací (SEM) a transmisní (TEM) elektronové mikroskopie: SEM/SE (secondary electrons imaging v SEM), TEM/BF (bright field imaging v TEM) SEM/EDX, TEM/EDX (energy dispersive analysis of X-rays v SEM a TEM), TEM/SAED (selected area electron diffraction v TEM). Description in English The contribution describes application of electron microscopy on microcrystals and nanocrystals. It deals with the following modes of scanning (SEM) and transmission electron microscopy (TEM): SEM/SE (secondary electrons imaging in SEM), TEM/BF (bright field imaging in TEM) SEM/EDX, TEM/EDX (energy dispersive analysis of X-rays in SEM and TEM), TEM/SAED (selected area electron diffraction in TEM). Workplace Institute of Macromolecular Chemistry Contact Eva Čechová, cechova@imc.cas.cz ; Tel.: 296 809 358 Year of Publishing 2011
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