Number of the records: 1
Noncontact Atomic Force Microscopy. Volume 2
- 1.
SYSNO ASEP 0342573 Document Type M - Monograph Chapter R&D Document Type Monograph Chapter Title Basic mechanisms for single atom manipulation in semiconductor systems with the FM-AFM Author(s) Pou, P. (ES)
Jelínek, Pavel (FZU-D) RID, ORCID
Pérez, R. (ES)Source Title Noncontact Atomic Force Microscopy. Volume 2. - Berlin : Springer, 2009 / Morita S. ; Giessibl F.J. ; Wiesendanger R. - ISSN 1434-4904 - ISBN 978-3-642-01494-9 Pages s. 227-248 Number of pages 22 s. Number of pages 401 Language eng - English Country DE - Germany Keywords AFM ; DFT simulation ; atomic manipulation Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects GA202/09/0775 GA ČR - Czech Science Foundation (CSF) IAA100100905 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) CEZ AV0Z10100521 - FZU-D (2005-2011) DOI 10.1007/978-3-642-01495-6_11 Annotation This work unveils the atomic-scale mechanisms that are responsible for the room temperature manipulations of strongly bound atoms on semiconductor surfaces. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2011
Number of the records: 1