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Electrophoresis deposition of metal nanoparticles with reverse micelles onto InP
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SYSNO ASEP 0341170 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Electrophoresis deposition of metal nanoparticles with reverse micelles onto InP Author(s) Žďánský, Karel (URE-Y)
Zavadil, Jiří (URE-Y) RID
Kacerovský, Pavel (URE-Y)
Lorinčík, Jan (URE-Y)
Vaniš, Jan (URE-Y) RID
Kostka, František (URE-Y)
Černohorský, O. (CZ)
Fojtík, A. (CZ)
Reboun, J. (CZ)
Čermák, Jan (FZU-D) RID, SAI, ORCIDSource Title International Journal of Materials Research. - : Walter de Gruyter - ISSN 1862-5282
Roč. 100, č. 9 (2009), s. 1234-1238Number of pages 5 s. Language eng - English Country DE - Germany Keywords semiconductor junctions ; nanostructures ; semiconductor devices Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering CEZ AV0Z20670512 - URE-Y (2005-2011) AV0Z50200510 - MBU-M (2005-2011) AV0Z10100521 - FZU-D (2005-2011) UT WOS 000270671600019 DOI 10.3139/146.110178 Annotation Nanolayers were deposited onto surfaces of n-type InP single crystal wafers by electrophoresis from reverse micelle colloid solutions containing palladium nanoparticles. Two types of nanolayers were deposited, by applying a positive potential or a negative potential on the InP wafer. The nanolayers were studied by capacitance–voltage characteristics, atomic force microscopy, secondary-ion mass spectroscopy and current–voltage characteristics. Correlations among measured characterizations were found. Workplace Institute of Radio Engineering and Electronics Contact Petr Vacek, vacek@ufe.cz, Tel.: 266 773 413, 266 773 438, 266 773 488 Year of Publishing 2010
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