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Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films

SYSNO ASEP	0340747
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films
Author(s)	Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID} Hovorka, Miloš (UPT-D) Hanzlíková, Renáta (UPT-D) Frank, Luděk (UPT-D)_{RID, SAI, ORCID}
Number of authors	4
Source Title	Materials Transactions. - : Japan Institute of Metals and Materials - ISSN 1345-9678 Roč. 51, č. 2 (2010), s. 265-270
Number of pages	6 s.
Language	eng - English
Country	JP - Japan
Keywords	low energy scanning electron microscopy ; thin foils ; transmission of very slow electrons
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
R&D Projects	IAA100650902 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
CEZ	AV0Z20650511 - UPT-D (2005-2011)
UT WOS	000276538900014
EID SCOPUS	77949670967
DOI	10.2320/matertrans.MC200915
Annotation	Instrument and methodology is presented for very low energy scanning transmission electron microscopy. The detector system provides simultaneous acquisitions of total reflected and transmitted electron fluxes. Introductory experiments incorporated examination of ultrathin foils of gold, carbon and graphene flakes. Extremely sensitive thickness contrast obtained at units of eV is demonstrated. The phenomenon of electron transmissivity apparently exceeding 100% owing to the contribution of secondary electrons released near to the exit surface is described and discussed.
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2010

Number of the records: 1