Number of the records: 1  

Grain Contrast Imaging in UHV SLEEM

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    SYSNO ASEP0340746
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleGrain Contrast Imaging in UHV SLEEM
    Author(s) Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
    Hovorka, Miloš (UPT-D)
    Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Man, O. (CZ)
    Pantělejev, L. (CZ)
    Frank, Luděk (UPT-D) RID, SAI, ORCID
    Number of authors6
    Source TitleMaterials Transactions. - : Japan Institute of Metals and Materials - ISSN 1345-9678
    Roč. 51, č. 2 (2010), s. 292-296
    Number of pages5 s.
    Languageeng - English
    CountryJP - Japan
    Keywordsscanning low energy electron microscopy ; electron backscatter diffraction (EBSD) ; grain contrast ; ultra-fine grained materials
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    R&D ProjectsOE08012 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    CEZAV0Z20650511 - UPT-D (2005-2011)
    UT WOS000276538900019
    EID SCOPUS77949718926
    DOI10.2320/matertrans.MC200919
    AnnotationStudy of the grain structure in the equal channel angular pressing processed copper by means of the cathode lens equipped ultrahigh vacuum scanning low energy electron microscope is reported. The grain contrast was found achieving its maximum at electron energies below about 30 eV where it alternated its sign and exhibited dependence on electron energy specific for the grain orientation. The energy dependence of the electron reflectance seemed to be capable of serving as a fingerprint enabling determination of the crystalline orientation. In the cathode lens mode at hundreds of eV fine details of the microstructure are also observable including twins and low angle grain boundaries. This is explained by acquisition of high-angle backscattered slow electrons, normally not acquired in standard scanning electron microscopes. The very low energy electron reflectance is promising as an alternative to the EBSD method owing to its high resolution and fast data acquisition.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2010
Number of the records: 1  

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