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New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors

SYSNO ASEP	0339531
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors
Author(s)	Sadewasser, S. (DE) Jelínek, Pavel (FZU-D)_{RID, ORCID} Fang, Ch.-K. (JP) Custance, Ó. (JP) Yamada, Y. (JP) Sugimoto, Y. (JP) Abe, M. (JP) Morita, S. (JP)
Source Title	Physical Review Letters. - : American Physical Society - ISSN 0031-9007 Roč. 103, č. 26 (2009), 266103/1-266103/4
Number of pages	4 s.
Language	eng - English
Country	US - United States
Keywords	KPFM ; atomic force microscopy ; DFT ; atomic resolution ; semiconductor surface
Subject RIV	BM - Solid Matter Physics ; Magnetism
R&D Projects	GA202/09/0545 GA ČR - Czech Science Foundation (CSF)
	IAA100100905 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
CEZ	AV0Z10100521 - FZU-D (2005-2011)
UT WOS	000273232200029
DOI	10.1103/PhysRevLett.103.266103
Annotation	We present dynamic force-microscopy experiment and first-principles simulations that contribute to clarify the origin of atomic-scale contrast in Kelvin-probe force-microscopy (KPFM) images of semiconductor surfaces.
Workplace	Institute of Physics
Contact	Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
Year of Publishing	2010

Number of the records: 1