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Decomposition of mixed phase silicon Raman spectra

SYSNO ASEP	0339516
Document Type	C - Proceedings Paper (int. conf.)
R&D Document Type	Conference Paper
Title	Decomposition of mixed phase silicon Raman spectra
Author(s)	Ledinský, Martin (FZU-D)_{RID, ORCID, SAI} Stuchlík, Jiří (FZU-D)_{RID, ORCID} Vetushka, Aliaksi (FZU-D)_{RID, ORCID} Fejfar, Antonín (FZU-D)_{RID, ORCID, SAI} Kočka, Jan (FZU-D)_{RID, ORCID, SAI}
Source Title	Amorphous and Polycrystalline Thin-Film Silicon Science and Technology — 2009. - Warrendale, PA : Materials Research Society, 2009 / Flewitt A. ; Wang Q. ; Hou J. ; Uchikoga S. ; Nathan A. - ISBN 978-1-60511-126-1
Pages	s. 15-20
Number of pages	6 s.
Action	MRS spring meating 2009
Event date	13.04.2009-17.04.2009
VEvent location	San Francisco, CA
Country	US - United States
Event type	WRD
Language	eng - English
Country	US - United States
Keywords	Raman spectroscopy ; silicon thin films ; photovoltaics
Subject RIV	BM - Solid Matter Physics ; Magnetism
R&D Projects	LC06040 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	KAN400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
	LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
CEZ	AV0Z10100521 - FZU-D (2005-2011)
Annotation	Series of Raman spectra were measured for microcrystalline silicon thin film with variable crystallinity. Five sets of Raman spectra (corresponding to excitations at 325 nm, 442 nm, 514.5 nm, 632.8 nm and 785 nm wavelengths) were subjected to factor analysis which showed that each set of spectra consisted of just two independent spectral components. Decomposition of the measured Raman spectra into the amorphous and the microcrystalline components is illustrated for 514.5 nm and 632.8 nm excitations. Effect of the light scattering on absolute intensity of Raman spectra was identified even for excitation wavelength highly absorbed in the mixed phase silicon layers.
Workplace	Institute of Physics
Contact	Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
Year of Publishing	2010

Number of the records: 1