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Advanced x-ray optics with Si wafers and slumped glass
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SYSNO ASEP 0337793 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Advanced x-ray optics with Si wafers and slumped glass Author(s) Hudec, René (ASU-R) RID, ORCID
Maršíková, V. (CZ)
Míka, M. (CZ)
Sik, J. (CZ)
Lorenz, M. (CZ)
Pína, L. (CZ)
Inneman, A. (CZ)
Skulinová, Michaela (ASU-R)Source Title Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV. - Bellingham : SPIE, 2009 / O'Dell S. - ISSN 0277-786X - ISBN 9780819477279 Pages 74370s-1-74370s-12 Number of pages 12 s. Publication form Print - P Action Optics for EUV, X-Ray, and Gamma-Ray Astronomy /4./ Event date 31.08.2009-31.08.2009 VEvent location San Diego Country US - United States Event type WRD Language eng - English Country US - United States Keywords x-ray optics ; Si wafers Subject RIV BN - Astronomy, Celestial Mechanics, Astrophysics R&D Projects GP202/07/P510 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z10030501 - ASU-R (2005-2011) Annotation We report on the continuation of the development of test samples of astronomical x-ray optics based on thermally formed glass foils and on bent Si wafers. Workplace Astronomical Institute Contact Radka Svašková, bibl@asu.cas.cz, Tel.: 323 620 326 Year of Publishing 2015
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