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Lu.sub.3./sub.Al.sub.5./sub.O.sub.12./sub.-based materials for high 2D-resolution scintillation detectors
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SYSNO ASEP 0337539 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Lu3Al5O12-based materials for high 2D-resolution scintillation detectors Title Lu3Al5O12 materiály pro 2D scintilační detektory s vysokým rozlišením Author(s) Nikl, Martin (FZU-D) RID, ORCID, SAI
Touš, J. (CZ)
Mareš, Jiří A. (FZU-D) RID, ORCID
Průša, Petr (FZU-D) RID, ORCID
Mihóková, Eva (FZU-D) RID, ORCID, SAI
Blažek, K. (CZ)
Vedda, A. (IT)
Zorenko, Y. (UA)
Gorbenko, V. (UA)
Babin, V. (EE)Source Title Non-Intrusive Inspection Technologies II. - Bellingham : SPIE, 2009 / Blackburn B.W. - ISSN 0277-786x - ISBN 9780819475763 Pages 731008/1-731008/10 Number of pages 10 s. Action Defense, Security, and Sensing 2009 Event date 13.04.2009-17.04.2009 VEvent location Orlando Country US - United States Event type WRD Language eng - English Country US - United States Keywords thin scintillator films ; 2D imaging ; Ce-doped Lu3Al5O12(LuAG) ; liquid phase epitaxy growth ; thermoluminescence Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects KAN300100802 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) CEZ AV0Z10100521 - FZU-D (2005-2011) Annotation About 20μm thick Ce-doped Lu3Al5O12 thin films grown by Liquid Phase Epitaxy and thin plates of similar thickness prepared by mechanical cutting and polishing from Czochralski grown crystals are used in 2D imaging experiment down to μm resolution. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2010
Number of the records: 1