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Electron attenuation anisotropy at crystal surfaces from LEED

  1. 1.
    SYSNO ASEP0336724
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleElectron attenuation anisotropy at crystal surfaces from LEED
    TitleHloubka tlumeni elektronu v krystalech z LEEDu
    Author(s) Romanyuk, Olexandr (FZU-D) RID, ORCID
    Bartoš, Igor (FZU-D) RID, ORCID
    Number of authors2
    Source TitleSurface Science. - : Elsevier - ISSN 0039-6028
    Roč. 603, č. 17 (2009), s. 2789-2792
    Number of pages4 s.
    Languageeng - English
    CountryNL - Netherlands
    Keywordselectron attenuation length, low energy electron diffraction, photoelectron diffraction, electron–solid scattering and transmission, copper ; low energy electron diffraction ; photoelectron diffraction ; electron–solid scattering and transmission ; copper
    Subject RIVBM - Solid Matter Physics ; Magnetism
    R&D ProjectsGA202/07/0601 GA ČR - Czech Science Foundation (CSF)
    IAA100100628 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    CEZAV0Z10100521 - FZU-D (2005-2011)
    UT WOS000270129100020
    DOI10.1016/j.susc.2009.07.024
    AnnotationDynamical theory of electron scattering is used to describe the electron transport in the surface regions of crystals. The angle resolved attenuation length of electrons is derived from the transmitted LEED electron current decay. Electron attenuation length energy dependence and anisotropy in polar angle are found for crystalline Cu(111) for two high symmetry azimuths. Pronounced anisotropy in polar angle distributions of attenuation lengths is found to be in qualitative agreement with the results obtained from the photoelectron diffraction. Comparison with the attenuation lengths obtained from semiclassical simulations for amorphous copper is given. This comparison demonstrates that simple transfers of the smoothly behaving surface sensitivity from amorphous materials oversimplifies the electron attenuation process and can lead to incorrect results in quantitative analyses of crystalline surfaces.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2010
Number of the records: 1  

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