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Laser-induced damage studies in optical elements using x-ray laser interferometric microscopy

  1. 1.
    SYSNO ASEP0336016
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleLaser-induced damage studies in optical elements using x-ray laser interferometric microscopy
    TitleStudium laserem uměle výtvořených poškození optických elementů pomocí RTG laserové mikroskopické interferometrie
    Author(s) Margarone, Daniele (FZU-D) RID, ORCID
    Kozlová, Michaela (FZU-D) RID, ORCID
    Nejdl, Jaroslav (FZU-D) RID, ORCID
    Rus, Bedřich (FZU-D) ORCID
    Mocek, Tomáš (FZU-D) RID, ORCID, SAI
    Homer, Pavel (FZU-D) RID
    Polan, Jiří (FZU-D)
    Stupka, Michal (FZU-D)
    Jamelot, G. (FR)
    Cassou, K. (FR)
    Kazamias, S. (FR)
    Klisnick, A. (FR)
    Ros, D. (FR)
    Bercegol, H. (FR)
    Danson, C. (GB)
    Hawkes, S. (GB)
    Source TitleDamage to VUV, EUV, and X-ray Optics II. - Bellingham : SPIE, 2009 / Juha L. ; Bajt S. ; Sobierajski R. - ISSN 0277-786x - ISBN 9780819476357
    Pages73610n/1-73610n/11
    Number of pages11 s.
    ActionDamage to VUV, EUV, and X-Ray Optics II
    Event date21.04.2009-23.04.2009
    VEvent locationPrague
    CountryCZ - Czech Republic
    Event typeWRD
    Languageeng - English
    CountryUS - United States
    Keywordsx-ray laser ; XUV interferometric microscopy ; laser-induced optical damage ; fused silica
    Subject RIVBH - Optics, Masers, Lasers
    R&D Projects7E08099 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LC528 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    CEZAV0Z10100523 - FZU-D (2005-2011)
    AnnotationResults of a novel X-ray laser application, aimed at understanding the microscopic effects involved in formation of laserinduced damage in optical materials exposed to sub-ns laser pulses, will be presented. Specifically, we studied thin plane beamsplitters that are presently the weakest element of the next generation of high-energy lasers (LMJ, NIF), with permanent damage threshold below 20 J/cm2. Standard fused silica substrates and a model system, containing welldefined micron grooves as seeding sites to trigger damage when irradiated by 438 nm laser pulses, were in situ probed by a neon-like zinc X-ray laser delivering up to 10 mJ at 21.2 nm.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2010
Number of the records: 1  

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