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Characterization of the focused beam from a 10-Hz desktop capillary-discharge 46.9-nm laser

SYSNO ASEP	0335795
Document Type	C - Proceedings Paper (int. conf.)
R&D Document Type	Conference Paper
Title	Characterization of the focused beam from a 10-Hz desktop capillary-discharge 46.9-nm laser
Title	Charakterizace fokusovaného 46,9 nm svazku 10 Hz stolního kapilárního laseru
Author(s)	Vyšín, Luděk (FZU-D)_{RID, ORCID} Burian, T. (CZ) Chalupský, Jaromír (FZU-D)_{RID, ORCID} Grisham, M. (US) Hájková, Věra (FZU-D)_{RID, ORCID} Heinbuch, S. (US) Jakubczak, Krzysztof (FZU-D) Martz, D. (US) Mocek, Tomáš (FZU-D)_{RID, ORCID, SAI} Pira, P. (CZ) Polan, Jiří (FZU-D) Rocca, J.J. (US) Rus, Bedřich (FZU-D)_ORCID Sobota, Jaroslav (UPT-D)_{RID, ORCID, SAI} Juha, Libor (FZU-D)_{RID, ORCID, SAI}
Source Title	Damage to VUV, EUV, and X-ray Optics II. - Bellingham : SPIE, 2009 / Juha L. ; Bajt S. ; Sobierajski R. - ISSN 0277-786x - ISBN 9780819476357
Pages	73610o/1-73610o/8
Number of pages	8 s.
Action	Damage to VUV, EUV, and X-Ray Optics II
Event date	21.04.2009-23.04.2009
VEvent location	Prague
Country	CZ - Czech Republic
Event type	WRD
Language	eng - English
Country	US - United States
Keywords	XUV laser ; capillary-discharge laser ; annular intensity distribution ; beam imprint ; photo-induced erosion
Subject RIV	BH - Optics, Masers, Lasers
R&D Projects	KAN300100702 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
	LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	LC528 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	LA08024 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	IAAX00100903 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
	GA203/06/1278 GA ČR - Czech Science Foundation (CSF)
	IAA400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
CEZ	AV0Z10100523 - FZU-D (2005-2011)
	AV0Z20650511 - UPT-D (2005-2011)
Annotation	The desktop size capillary-discharge Ne-like Ar laser (CDL) providing 10-μJ nanosecond pulses of coherent 46.9-nm radiation with a repetition rate up to 12 Hz was developed and built at the Colorado State University in Fort Collins and then installed in Prague. The beam of the laser was focused by a spherical mirror covered with Si/Sc multilayer coating onto the surface of poly(methyl methacrylate) - PMMA. Interaction parameters vary by changing the distance between sample surface and beam focus. The samples were exposed to various numbers of shots. Analysis of damaged PMMA by atomic force (AFM) and Nomarski (DIC – differential interference contrast) microscopes allows not only to determine the key characteristics of the focused beam (e.g. Rayleigh’s parameter, focal spot diameter, tight focus position, etc.) but also to investigate mechanisms of the radiation-induced erosion processes.
Workplace	Institute of Physics
Contact	Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
Year of Publishing	2010

Number of the records: 1