Number of the records: 1

Damage thresholds of various materials irradiated by 100-ps pulses of 21.2-nm laser radiation

SYSNO ASEP	0335777
Document Type	C - Proceedings Paper (int. conf.)
R&D Document Type	Conference Paper
Title	Damage thresholds of various materials irradiated by 100-ps pulses of 21.2-nm laser radiation
Title	Prahy poškození různých materiálů ozářených 100-ps pulzy laserového záření o vlnové délce 21,2 nm
Author(s)	Hájková, Věra (FZU-D)_{RID, ORCID} Chalupský, Jaromír (FZU-D)_{RID, ORCID} Wabnitz, H. (DE) Feldhaus, J. (DE) Störmer, M. (DE) Hecquet, Ch. (FR) Mocek, Tomáš (FZU-D)_{RID, ORCID, SAI} Kozlová, Michaela (FZU-D)_{RID, ORCID} Polan, Jiří (FZU-D) Homer, Pavel (FZU-D)_RID Rus, Bedřich (FZU-D)_ORCID Juha, Libor (FZU-D)_{RID, ORCID, SAI}
Source Title	Damage to VUV, EUV, and X-ray Optics II. - Bellingham : SPIE, 2009 / Juha L. ; Bajt S. ; Sobierajski R. - ISSN 0277-786x - ISBN 9780819476357
Pages	736110/1-736110/6
Number of pages	6 s.
Action	Damage to VUV, EUV, and X-Ray Optics II
Event date	21.04.2009-23.04.2009
VEvent location	Prague
Country	CZ - Czech Republic
Event type	WRD
Language	eng - English
Country	US - United States
Keywords	soft x-ray laser ; damage to x-ray optics ; laser ablation ; damage thresholds ; single-shot damage
Subject RIV	BH - Optics, Masers, Lasers
R&D Projects	KAN300100702 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
	LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	LC528 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	LA08024 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	IAA400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
CEZ	AV0Z10100523 - FZU-D (2005-2011)
Annotation	Irradiation experiments were conducted at Prague Asterix Laser System (PALS) with the Ne-like zinc soft x-ray laser (SXRL) at 21.2 nm (58.5 eV) delivering up to 4 mJ (~4 x 1014 photons), 100-ps pulses in a narrowly collimated beam. The thresholds determined with the 100-ps pulses from the plasma-based, quasi-steady state SXRL are significantly higher than the thresholds obtained for 20-fs pulses provided by the SXR free-electron laser in Hamburg. There is a difference in PMMA thresholds of two orders of magnitude for these two sources.
Workplace	Institute of Physics
Contact	Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
Year of Publishing	2010

Number of the records: 1