Number of the records: 1  

Cathodoluminescence study of electron beam formed defects in polysilanes

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    SYSNO ASEP0335270
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleCathodoluminescence study of electron beam formed defects in polysilanes
    Author(s) Schauer, P. (CZ)
    Schauer, Petr (UPT-D) RID, SAI, ORCID
    Kuřitka, I. (CZ)
    Nešpůrek, Stanislav (UMCH-V) RID
    Source TitleMC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. - Graz : Verlag der Technischen Universität, 2009 - ISBN 978-3-85125-062-6
    Pagesvol. 3: 383-384
    Number of pages2 s.
    ActionMC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./
    Event date30.08.2009-04.09.2009
    VEvent locationGraz
    CountryAT - Austria
    Event typeWRD
    Languageeng - English
    CountryAT - Austria
    Keywordscathodoluminescence ; electron beam degradation ; poly[methyl(phenyl)silane] ; PMPSi ; silicon polymers
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    R&D ProjectsIAA100100622 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    CEZAV0Z20650511 - UPT-D (2005-2011)
    AV0Z40500505 - UMCH-V (2005-2011)
    AnnotationIn materials science and semiconductor engineering, cathodoluminescence (CL) is a very efficient tool for the study of electronic substance structure and application possibilities. In spite of this, CL is only very rarely used for investigation of polymers. Recently Wellman et al introduced CL as an important tool for the investigation of materials for organic electroluminescence devices. It is evident that CL may become a strong tool for the investigation of polymer light emission possibilities as well as for investigation of triplet harvester organic solar cells. Our interest has been focused on the group of polysilanes (often also called polysilylanes), especially on poly[methyl(phenyl)silane] (PMPSi), having linear backbone of linked silicon atoms. Cathodoluminescence study of electron beam formed defects in PMPSi is presented in this paper.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2010
Number of the records: 1  

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