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Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses

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    SYSNO ASEP0334060
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleNon-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses
    TitleNetepelná desorpce/ablace molekulárních pevných látek indukovaná ultra-krátkými pulsy měkkého rentgenového záření
    Author(s) Chalupský, Jaromír (FZU-D) RID, ORCID
    Juha, Libor (FZU-D) RID, ORCID, SAI
    Hájková, Věra (FZU-D) RID, ORCID
    Cihelka, Jaroslav (FZU-D)
    Vyšín, Luděk (FZU-D) RID, ORCID
    Gautier, J. (FR)
    Hajdu, J. (SE)
    Hau-Riege, S.P. (US)
    Jurek, M. (PL)
    Krzywinski, J. (PL)
    London, R.A. (US)
    Papalazarou, E. (FR)
    Pelka, J. B. (PL)
    Rey, G. (FR)
    Sebban, S. (FR)
    Sobierajski, R. (PL)
    Stojanovic, N. (DE)
    Tiedtke, K. (DE)
    Toleikis, S. (DE)
    Tschentscher, T. (DE)
    Valentin, C. (FR)
    Wabnitz, H. (DE)
    Zeitoun, P. (FR)
    Source TitleOptics Express. - : Optical Society of America - ISSN 1094-4087
    Roč. 17, č. 1 (2009), s. 208-217
    Number of pages10 s.
    Languageeng - English
    CountryUS - United States
    Keywordsx-ray laser ; high-order harmonics ; free-electron laser ; desorption ; ablation ; organic polymer
    Subject RIVBH - Optics, Masers, Lasers
    R&D ProjectsKAN300100702 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LC528 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LA08024 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    IAA400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    CEZAV0Z10100523 - FZU-D (2005-2011)
    UT WOS000262220300024
    DOI10.1364/OE.17.000208
    AnnotationWe report the first observation of single-shot soft x-ray laser induced desorption occurring below the ablation threshold in a thin layer of poly ( methyl methacrylate) - PMMA. Irradiated by the focused beam from the Free-electron LASer in Hamburg ( FLASH) at 21.7nm, the samples have been investigated by atomic-force microscope (AFM) enabling the visualization of mild surface modifications caused by the desorption. A model describing non-thermal desorption and ablation has been developed and used to analyze single-shot imprints in PMMA. An intermediate regime of materials removal has been found, confirming model predictions. We also report below-threshold multiple-shot desorption of PMMA induced by high-order harmonics (HOH) at 32nm. Short-time exposure imprints provide sufficient information about transverse beam profile in HOH's tight focus whereas long-time exposed PMMA exhibits radiation-initiated surface hardening making the beam profile measurement infeasible.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2010
Number of the records: 1  

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