Soft x-ray free electron laser microfocus for exploring matter under extreme conditions

Nelson, A.J.; Toleikis, S.; Chapman, H.; Bajt, S.; Krzywinski, J.; Chalupský, Jaromír; Juha, Libor; Cihelka, Jaroslav; Hájková, Věra; Vyšín, Luděk; Burian, T.; Kozlová, Michaela; Fäustlin, R.R.; Nagler, B.; Vinko, S.M.; Whitcher, T.; Dzelzainis, T.; Renner, Oldřich; Saksl, K.; Khorsand, A.R.; Heimann, P.A.; Sobierajski, R.; Klinger, D.; Jurek, M.; Pelka, J.; Iwan, B.; Andreasson, J.; Timneanu, N.; Fajardo, M.; Wark, J. S.; Riley, D.; Tschentscher, T.; Hajdu, J.; Lee, R. W.

doi:https://dx.doi.org/10.1364/OE.17.018271

Number of the records: 1

Soft x-ray free electron laser microfocus for exploring matter under extreme conditions

1.

SYSNO ASEP	0334006
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Soft x-ray free electron laser microfocus for exploring matter under extreme conditions
Title	Mikrofokusace svazku měkkého rentgenového laseru s volnými elektrony pro potřeby výzkum chování hmoty za extrémních podmínek
Author(s)	Nelson, A.J. (US) Toleikis, S. (DE) Chapman, H. (DE) Bajt, S. (DE) Krzywinski, J. (US) Chalupský, Jaromír (FZU-D)_{RID, ORCID} Juha, Libor (FZU-D)_{RID, ORCID, SAI} Cihelka, Jaroslav (FZU-D) Hájková, Věra (FZU-D)_{RID, ORCID} Vyšín, Luděk (FZU-D)_{RID, ORCID} Burian, T. (CZ) Kozlová, Michaela (FZU-D)_{RID, ORCID} Fäustlin, R.R. (DE) Nagler, B. (GB) Vinko, S.M. (GB) Whitcher, T. (GB) Dzelzainis, T. (GB) Renner, Oldřich (FZU-D)_{RID, ORCID} Saksl, K. (SK) Khorsand, A.R. (NL) Heimann, P.A. (US) Sobierajski, R. (PL) Klinger, D. (PL) Jurek, M. (PL) Pelka, J. (PL) Iwan, B. (SE) Andreasson, J. (SE) Timneanu, N. (SE) Fajardo, M. (PT) Wark, J. S. (GB) Riley, D. (GB) Tschentscher, T. (DE) Hajdu, J. (SE) Lee, R. W. (US)
Source Title	Optics Express. - : Optical Society of America - ISSN 1094-4087 Roč. 17, č. 20 (2009), s. 18271-18278
Number of pages	8 s.
Language	eng - English
Country	US - United States
Keywords	microfocus ; multilayer mirror ; off-axis parabola ; x-ray free-electron laser
Subject RIV	BH - Optics, Masers, Lasers
R&D Projects	KAN300100702 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
	LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	LC528 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	LA08024 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	IAAX00100903 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
	IAA400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
CEZ	AV0Z10100523 - FZU-D (2005-2011)
UT WOS	000270295300112
DOI	10.1364/OE.17.018271
Annotation	We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 mu J, 5Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The OAP was mounted and aligned with a picomotor controlled six-axis gimbal. Beam imprints on poly(methyl methacrylate) -PMMA were used to measure focus and the focused beam was used to create isochoric heating of various slab targets. Results show the focal spot has a diameter of <= 1 mu m. Observations were correlated with simulations of best focus to provide further relevant information.
Workplace	Institute of Physics
Contact	Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
Year of Publishing	2010

Number of the records: 1