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Perspective for high energy density studies on x-ray FELs
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SYSNO ASEP 0333987 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Perspective for high energy density studies on x-ray FELs Title Perspektivy fyziky vysokých hustot energie na X-ray FEL Author(s) Lee, R. W. (US)
Nagler, B. (GB)
Zastrau, U. (DE)
Fäustlin, R. (DE)
Vinko, S.M. (GB)
Whitcher, T. (GB)
Sobierajski, R. (PL)
Krzywinski, J. (US)
Juha, Libor (FZU-D) RID, ORCID, SAI
Nelson, A.J. (US)
Bajt, S. (DE)
Budil, K. (US)
Cauble, R.C. (US)
Bornath, T. (DE)
Burian, T. (CZ)
Chalupský, Jaromír (FZU-D) RID, ORCID
Chapman, H. (DE)
Cihelka, Jaroslav (UFCH-W)
Döppner, T. (US)
Dzelzainis, T. (GB)
Hájková, Věra (FZU-D) RID, ORCID
Kozlová, Michaela (FZU-D) RID, ORCID
Laarmann, T. (DE)
Lee, H.-J. (US)
Meiwes-Broer, K.-H. (DE)
Mercere, P. (FR)
Murphy, W.J. (GB)
Przystawik, A. (DE)
Riley, D. (GB)
Röpke, G. (DE)
Saksl, K. (SK)
Thiele, R. (DE)
Toleikis, S. (DE)
Uschmann, I. (DE)
Falcone, R.W. (US)
Shepherd, R. (US)
Hastings, J.B. (US)
Wark, J. S. (GB)Number of authors 55 Source Title Soft X-Ray Lasers and Applications VIII. - Bellingham : SPIE, 2009 / Dunn J. ; Tallents G.J. - ISSN 0277-786X - ISBN 9780819477415 Pages 74510e /1-74510e /7 Number of pages 7 s. Action Soft X-Ray Lasers and Applications /8./ Event date 04.08.2009-06.08.2009 VEvent location San Diego Country US - United States Event type WRD Language eng - English Country US - United States Keywords FLASH ; x-ray FEL ; high energy density Subject RIV BH - Optics, Masers, Lasers R&D Projects GA202/08/1734 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z10100523 - FZU-D (2005-2011) AV0Z40400503 - UFCH-W (2005-2011) Annotation We report on the x-ray absorption of Warm Dense Matter experiment at the FLASH Free Electron Laser (FEL) facility at DESY. The FEL beam is used to produce Warm Dense Matter with soft x-ray absorption as the probe of electronic structure. A multilayer-coated parabolic mirror focuses the FEL radiation, to spot sizes as small as 0.3µm in a ~15fs pulse of containing >1012 photons at 13.5 nm wavelength, onto a thin sample. Silicon photodiodes measure the transmitted and reflected beams, while spectroscopy provides detailed measurement of the temperature of the sample. The goal is to measure over a range of intensities approaching 1018 W/cm2. Experimental results will be presented along with theoretical calculations. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2010
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