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Calculation of aberration coefficients by ray tracing
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SYSNO ASEP 0333615 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Calculation of aberration coefficients by ray tracing Author(s) Oral, Martin (UPT-D) RID, ORCID, SAI
Lencová, Bohumila (UPT-D) RID, SAINumber of authors 2 Source Title Ultramicroscopy. - : Elsevier - ISSN 0304-3991
Roč. 109, č. 11 (2009), s. 1365-1373Number of pages 9 s. Language eng - English Country NL - Netherlands Keywords Aberrations ; Aberration coefficients ; Ray tracing ; Regression ; Fitting Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering R&D Projects IAA100650805 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) CEZ AV0Z20650511 - UPT-D (2005-2011) UT WOS 000270765800008 DOI 10.1016/j.ultramic.2009.07.001 Annotation We present an approach for the calculation of aberration coefficients using accurate ray tracing. For a given optical system, intersections of a large number of trajectories with a given plane are computed. In the Gaussian image plane the imaging with the selected optical system can be described by paraxial and aberration coefficients (geometric and chromatic) that can be calculated by least-squares fitting of the analytical model on the computed trajectory positions. An advantage of such a way of computing the aberration coefficients is that, in comparison with the aberration integrals and the differential algebra method, it is relatively easy to use and its complexity stays almost constant with the growing complexity of the optical system. This paper shows a tested procedure for choosing proper initial conditions and computing the coefficients of the fifth-order geometrical and third-order, first-degree chromatic aberrations by ray tracing on an example of a weak electrostatic lens. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2010
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