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Thin film description by wavelet coefficients statistics
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SYSNO ASEP 0330290 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Thin film description by wavelet coefficients statistics Title Popis tenkých vrstev pomocí statistik založených na waveletových koeficientech Author(s) Boldyš, Jiří (UTIA-B) RID
Hrach, R. (CZ)Source Title Czechoslovak Journal of Physics. - : Springer - ISSN 0011-4626
Roč. 55, č. 1 (2005), s. 55-64Number of pages 10 s. Language eng - English Country NL - Netherlands Keywords thin films ; wavelet transform ; descriptors ; histogram model Subject RIV BD - Theory of Information CEZ AV0Z10750506 - UTIA-B (2005-2011) UT WOS 000227266200007 DOI 10.1007/s10582-005-0007-0 Annotation Descriptive and robust features based on wavelet transform coefficients are proposed for a multiscale thin film image analysis. The features are based on one- and two-dimensional histograms of the wavelet transform coefficients and they can be calculated for every scale of the wavelet decomposition. A one-dimensional histogram model is extended to describe also two-dimensional histograms, by means of calculating marginal histograms and by sampling the two-dimensional histograms in orientation. A computer experiment has been performed to demonstrate correspondence of the derived features to various physical phenomena. Workplace Institute of Information Theory and Automation Contact Markéta Votavová, votavova@utia.cas.cz, Tel.: 266 052 201. Year of Publishing 2010
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