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Spectroscopic ellipsometry applied to phase transitions in solids: possibilities and limitations
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SYSNO ASEP 0330031 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Spectroscopic ellipsometry applied to phase transitions in solids: possibilities and limitations Title Aplikace spektrální elipsometrie při studiu fázových přechodů v pevných látkách: možnosti a limity Author(s) Dejneka, Alexandr (FZU-D) RID, ORCID
Aulika, I. (LT)
Trepakov, Vladimír (FZU-D) RID
Křepelka, Jaromír (FZU-D)
Jastrabík, Lubomír (FZU-D) RID, ORCID
Hubička, Zdeněk (FZU-D) RID, ORCID, SAI
Lynnyková, Anna (FZU-D) RIDSource Title Optics Express. - : Optical Society of America - ISSN 1094-4087
Roč. 17, č. 16 (2009), 14322-14338Number of pages 17 s. Language eng - English Country US - United States Keywords spectroscopic ellipsometry ; phase transitions ; oxide thin films and crystals ; optics at surfaces Subject RIV BH - Optics, Masers, Lasers R&D Projects GC202/09/J017 GA ČR - Czech Science Foundation (CSF) KJB100100703 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) KAN301370701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) 1M06002 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z10100522 - FZU-D (2005-2011) UT WOS 000268843700109 DOI 10.1364/OE.17.014322 Annotation The possibilities of in situ spectroscopic ellipsometry applied to phase transitions investigation in oxide thin films and crystals are examined in this work, along with the use of various parameters calculated from ellipsometric data (band gap energy Eg, refractive index n and surface roughness) together with the directly measured main ellipsometric angles ψ and Δ, for the detection of phase transitions. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2010
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