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Surface and grain-boundary segregation studied by quantitative AES and XPS

SYSNO ASEP	0329993
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Surface and grain-boundary segregation studied by quantitative AES and XPS
Title	Segregace příměsí na hranicích zrn a volných površích studovaná kvantitativní AES a XPS
Author(s)	Hofmann, S. (DE) Lejček, Pavel (FZU-D)_{RID, ORCID, SAI}
Number of authors	2
Source Title	International Journal of Materials Research. - : Walter de Gruyter - ISSN 1862-5282 Roč. 100, č. 9 (2009), s. 1167-1172
Number of pages	6 s.
Language	eng - English
Country	DE - Germany
Keywords	interfacial segregation ; AES ; XPS ; hermodynamic state functions
Subject RIV	BM - Solid Matter Physics ; Magnetism
CEZ	AV0Z10100520 - FZU-D (2005-2011)
UT WOS	000270671600002
DOI	10.3139/146.110162
Annotation	Applied surface and interface analysis methods such as Auger electron spectroscopy and X-ray photoelectron spectroscopy are particularly well suited to studying intergranular segregation. Advantages and disadvantages of different approaches are discussed.
Workplace	Institute of Physics
Contact	Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
Year of Publishing	2010

Number of the records: 1