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Highly oriented crystalline Er:YAG and Er:YAP layers prepared by PLD and annealing
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SYSNO ASEP 0328762 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Highly oriented crystalline Er:YAG and Er:YAP layers prepared by PLD and annealing Title Vysoce orientované krystalické vrstvy Er:YAG a Er:YAP připravené pomocí PLD a přežíhané Author(s) Remsa, Jan (FZU-D) RID, ORCID
Jelínek, Miroslav (FZU-D) RID, ORCID
Kocourek, Tomáš (FZU-D) RID, ORCID, SAI
Oswald, Jiří (FZU-D) RID, ORCID
Studnička, Václav (FZU-D) RID
Čerňanský, Marian (FZU-D) RID
Uherek, F. (SK)
Jelínek, M. (CZ)Number of authors 8 Source Title Applied Surface Science. - : Elsevier - ISSN 0169-4332
Roč. 255, č. 10 (2009), s. 5292-5294Number of pages 3 s. Language eng - English Country NL - Netherlands Keywords Er:YAG ; thin films ; waveguides ; PLD ; laser Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects GA202/06/0216 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z10100522 - FZU-D (2005-2011) UT WOS 000263865000042 DOI 10.1016/j.apsusc.2008.08.037 Annotation High quality, thick, highly oriented crystalline thin films of Yttrium Aluminum Garnet (Y3Al5O12) and Yttrium Aluminum Perovskite (YAlO3) doped with Erbium were prepared by pulsed laser deposition. Samples were created in vacuum or oxygen environment. Depositions were arranged at room temperature, or at high substrate temperatures ranging from 800 to 1100 8C. Amorphous layers were annealed by laser, or in oven (argon flow, temperatures in range from 1200 to 1400 8C). Fused silica and sapphire (0 0 0 1) were used as substrates. Properties of films were characterized by X-ray diffraction, atomic force microscopy, and by photoluminescence measurement. Size of crystalline grains was in the range 116–773 nm. Thickness of layers was up to 17 mm. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2010
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