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Determination of electron inelastic mean free paths for poly[methyl(phenyl)silylene] films

SYSNO ASEP	0328517
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Determination of electron inelastic mean free paths for poly[methyl(phenyl)silylene] films
Title	Stanovení středních neelastických volných drah elektronů v tenkých vrstvách polymetylfenyl silylenu
Author(s)	Zemek, Josef (FZU-D)_{RID, ORCID} Houdková, Jana (FZU-D)_{RID, ORCID} Jiříček, Petr (FZU-D)_{RID, ORCID, SAI} Jablonski, A. (PL) Jurka, Vlastimil (FZU-D)_{RID, ORCID} Kub, Jiří (FZU-D)_{RID, ORCID}
Number of authors	6
Source Title	Polymer. - : Elsevier - ISSN 0032-3861 Roč. 50, č. 11 (2009), s. 2445-2450
Number of pages	6 s.
Language	eng - English
Country	GB - United Kingdom
Keywords	polymer physics ; poly[methyl(phenyl)silylene] ; inelastic mean free path
Subject RIV	BM - Solid Matter Physics ; Magnetism
R&D Projects	GA202/09/0428 GA ČR - Czech Science Foundation (CSF)
	IAA100100622 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
CEZ	AV0Z10100521 - FZU-D (2005-2011)
UT WOS	000266319100013
DOI	10.1016/j.polymer.2009.03.031
Annotation	The IMFP of electrons at a poly[methyl(phenyl)silylene] film surface were determined using elastic peak electron spectroscopy and Monte Carlo calculations.
Workplace	Institute of Physics
Contact	Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
Year of Publishing	2010

Number of the records: 1