Number of the records: 1  

Space resolved optical emission spectroscopy during deposition of Ba.sub.x./sub.Sr.sub.1-x./sub.TiO.sub.3./sub. thin films by double hollow cathode plasma Jet system

  1. 1.
    SYSNO ASEP0326764
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleSpace resolved optical emission spectroscopy during deposition of BaxSr1-xTiO3 thin films by double hollow cathode plasma Jet system
    TitleProstorově rozlišená optická emisní spektroskopie během depozice tenkých vrstev BaxSr1-xTiO3 pomocí dvojtryskového plazma-jet systému
    Author(s) Olejníček, Jiří (FZU-D) RID, ORCID
    Hubička, Zdeněk (FZU-D) RID, ORCID, SAI
    Čada, Martin (FZU-D) RID, ORCID, SAI
    Virostko, Petr (FZU-D)
    Kment, Štěpán (FZU-D) RID, ORCID
    Adámek, Petr (FZU-D) RID, ORCID
    Jastrabík, Lubomír (FZU-D) RID, ORCID
    Dejneka, Alexandr (FZU-D) RID, ORCID
    Number of authors8
    Source TitleMaterials Science Forum - ISSN 0255-5476
    Roč. 609, - (2009), s. 105-109
    Number of pages5 s.
    ActionInternational Conference on Thin Films and Porous Materials /1./
    Event date19.05.2008-22.05.2008
    VEvent locationAlgiers
    CountryDZ - Algeria
    Event typeWRD
    Languageeng - English
    CountryCH - Switzerland
    KeywordsBaxSr1-xTiO3 ; BSTO ; ferroelectric films ; hollow cathode ; optical emission spectroscopy
    Subject RIVBM - Solid Matter Physics ; Magnetism
    R&D ProjectsGA202/08/1009 GA ČR - Czech Science Foundation (CSF)
    KJB100100707 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    KAN301370701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    1M06002 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    CEZAV0Z10100522 - FZU-D (2005-2011)
    UT WOS000264750100016
    DOI10.4028/3-908454-02-6.105
    AnnotationPulse modulated double hollow cathode RF plasma jet system with two separate independent nozzles made of BaTiO3 (BTO) and SrTiO3 (STO) was used for deposition of BSTO thin films on Si and on multi-layer Si/SiO2/TiO2/Pt substrates. Space resolved optical emission spectroscopy (OES) was used mainly for monitoring of concentration of particles sputtered from the hollow cathode and for feedback correction of power supplied in both nozzles because applied power was responsible for sputtering speed of Ba and Sr particles. Main attention was focused on relation between ratio of spectral intensity of Ba, Ba+, Sr and Sr+ lines close to substrate and ratio of Ba and Sr concentration in the deposited film. 2D map of emission lines intensity distribution for Ba, Ba+, Sr, Sr+, Ti, Ar, and Ar+ for double hollow cathode plasma jet system with BTO and STO nozzles was created.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2010
Number of the records: 1  

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