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Polar phonons in some compressively stressed epitaxial and polycrystalline SrTiO.sub.3./sub. thin films

SYSNO ASEP	0325010
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Polar phonons in some compressively stressed epitaxial and polycrystalline SrTiO₃ thin films
Title	Polarní fonony v některých stlačených epitaxních a polykrystalických SrTiO₃ tenkých vrstvách
Author(s)	Nuzhnyy, Dmitry (FZU-D)_{RID, ORCID} Petzelt, Jan (FZU-D)_{RID, ORCID, SAI} Kamba, Stanislav (FZU-D)_{RID, ORCID, SAI} Yamada, T. (CH) Tyunina, M. (FI) Tagantsev, A.K. (CH) Levoska, J. (FI) Setter, N. (CH)
Source Title	Journal of Electroceramics - ISSN 1385-3449 Roč. 22, 1-3 (2009), 297-301
Number of pages	5 s.
Language	eng - English
Country	NL - Netherlands
Keywords	soft mode ; thin film ; infrared spectroscopy
Subject RIV	BM - Solid Matter Physics ; Magnetism
R&D Projects	KJB100100704 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
	OC 101 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
CEZ	AV0Z10100520 - FZU-D (2005-2011)
UT WOS	000263498800051
DOI	10.1007/s10832-008-9494-2
Annotation	The infrared spectroscopy (both in transmission as well as reflection mode) was used for quantitative determination of the dielectric response of polar phonon modes in compressively stressed epitaxial and polycrystalline SrTiO3 thin films down to the thickness of the order of several tens nm. Compressed epitaxial SrTiO3 films show appreciably stiffened polar mode frequencies resulting in reduced static permittivity. In polycrystalline thin films the soft mode response is much broader than in epitaxial films, due to the grain boundaries and other in-plane inhomogeneities.
Workplace	Institute of Physics
Contact	Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
Year of Publishing	2009

Number of the records: 1