Number of the records: 1  

Characterisation of Ni+ implanted PEEK, PET and PI

  1. 1.
    SYSNO ASEP0324684
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JOstatní články
    TitleCharacterisation of Ni+ implanted PEEK, PET and PI
    TitleCharakterizace polymerů PEEK, PET a PI implantovaných Ni+ ionty
    Author(s) Macková, Anna (UJF-V) RID, ORCID, SAI
    Bočan, Jiří (UJF-V)
    Khaibulline, R. (RU)
    Valeev, V. F. (RU)
    Slepička, P. (CZ)
    Sajdl, P. (CZ)
    Švorčík, V. (CZ)
    Number of authors7
    Source TitleNuclear Instruments & Methods in Physics Research Section B. - : Elsevier - ISSN 0168-583X
    Roč. 267, - (2009), s. 1549-1552
    Number of pages4 s.
    Languageeng - English
    CountryNL - Netherlands
    KeywordsIon implantation ; Polymers ; TRIDYN ; RBS ; XPS ; Depth profiles
    Subject RIVBG - Nuclear, Atomic and Molecular Physics, Colliders
    R&D ProjectsLC06041 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    KJB100480601 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    CEZAV0Z10480505 - UJF-V (2005-2011)
    AnnotationPolyimide (PI), polyetheretherketone (PEEK) and polyethyleneterephthalate (PET) were implanted with 40 keV Ni+ ions at room temperature at fluences ranging from 10^16 to 1.5x10^17 ions cm-2. The depth profiles of the implanted Ni atoms were determined by the RBS technique and compared with those predicted by the SRIM and TRIDYN codes. Hydrogen depletion as a function of the ion fluence was determined by the ERDA technique, and the compositional and structural changes of the polymers were characterised by the UV–vis and XPS methods. The implanted profiles differed significantly from those predicted by the SRIM code while the lower fluences were satisfactorily described by the TRIDYN simulation. A significant hydrogen release from the polymer surface layer was observed along with significant changes in the surface layer composition. The UV–vis results indicated an increase of the concentration of double bonds, XPS showed increasing concentration Ni0+ with the increasing ion fluence.
    WorkplaceNuclear Physics Institute
    ContactMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
    Year of Publishing2009
Number of the records: 1  

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