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Thickness dependence of nanofilm elastic modulus
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SYSNO ASEP 0323549 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Thickness dependence of nanofilm elastic modulus Title Závislost modulu pružnosti nanofilmu na jeho tloušťce Author(s) Fedorchenko, Alexander I. (UT-L) RID
Wang, A. B. (TW)
Cheng, H.H. (TW)Source Title Applied Physics Letters. - : AIP Publishing - ISSN 0003-6951
Roč. 94, č. 15 (2009), s. 152111-152113Number of pages 3 s. Language eng - English Country US - United States Keywords nanofilm ; elastic modulus ; thickness dependence Subject RIV BM - Solid Matter Physics ; Magnetism CEZ AV0Z20760514 - UT-L (2005-2011) UT WOS 000265285200045 DOI 10.1063/1.3120763 Annotation Young’s modulus is a fundamental physical parameter that determines both the mechanic and electronic properties of a solid thin film. In here, we show that the elastic modulus is not a constant as that of conventional treatment but varies with film thickness. It has been shown that there exists some film thickness hb when the surface energy comes into play. The hb is inverse proportional to the bulk Young’s modulus and depends strongly on the in-plain strain. For Si nanofilms, the dimensionless elastic modulus E/Ebulk can be presented as a power function of the dimensionless film thickness h/hb. Workplace Institute of Thermomechanics Contact Marie Kajprová, kajprova@it.cas.cz, Tel.: 266 053 154 ; Jana Lahovská, jaja@it.cas.cz, Tel.: 266 053 823 Year of Publishing 2010
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