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RBS, UV-VIS and XPS characterization of 40 keV Ni+ implanted PEEK, PET and PI
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SYSNO ASEP 0315789 R&D Document Type The record was not marked in the RIV Title RBS, UV-VIS and XPS characterization of 40 keV Ni+ implanted PEEK, PET and PI Title RBS, UV-VIS a XPS charakterizace Ni+ 40 keV implantovaných polymerů PEEK, PET a PI Author(s) Macková, Anna (UJF-V) RID, ORCID, SAI
Bočan, Jiří (UJF-V)
Khaibullin, R. I. (RU)
Švorčík, V. (CZ)
Slepička, P. (CZ)
Siegel, J. (CZ)
Valeev, V. F. (RU)Source Title 16th International Conference on Ion Beam Modification of Materials Book of Abstracts. - Dresden : Institute of Ion Beam Physics and Materials Research, Forschungzentrum Dresden-Rossendorf, 2008
S. 317-317Number of pages 1 s. Action 16th International Conference on Ion Beam Modification of Materials Event date 31.08.2008-05.09.2008 VEvent location Dresden Country DE - Germany Event type WRD Language eng - English Country DE - Germany Keywords ion implantation in polymers ; TRIDYN ; Ion Beam Analysis ; UV-VIS, XPS Subject RIV JI - Composite Materials R&D Projects KJB100480601 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) LC06041 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z10480505 - UJF-V (2005-2011) Annotation Polyimide (PI), polyetheretherketone (PEEK), and polyethyleneterephtalate (PET) were implanted with 40 keV Ni+ ions at room temperature at fluences from 1,0 . 1016 ions cm-2 to 1,5 . 1017 ions cm-2 and at different ion currents from 4microA to 10microA. The depth profiles of implanted Ni atoms determined by RBS technique are compared with those predicted by SRIM and TRIDYN codes. Hydrogen depletion as a function of the ion fluence was determined by ERDA technique and compositional and structural changes of the polymers were characterized by UV-VIS and XPS methods. The implanted profiles differ significantly from those predicted by the SRIM code and for lower fluences they can satisfactorily be described by the TRIDYN simulation. A significant hydrogen escape is observed from the polymer surface layer together with significant changes in the surface layer composition. UV-VIS results indicate an increase in the concentration and conjugation of double bonds. Workplace Nuclear Physics Institute Contact Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Year of Publishing 2009
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