Doubly charged ion emission in sputtering of monocrystalline fluorides
1.
SYSNO ASEP
0303940
Document Type
J - Journal Article
R&D Document Type
Journal Article
R&D Document Type
M - Uspořádání konference
Subsidiary J
Ostatní články
Title
Doubly charged ion emission in sputtering of monocrystalline fluorides
Author(s)
Lörinčík, Jan (UFCH-W) Šroubek, Zdeněk (URE-Y)
Source Title
Nuclear Instruments & Methods in Physics Research Section B. - : Elsevier
- ISSN 0168-583X
Roč. 187, č. 4 (2002), s. 447-450
Number of pages
4 s.
Action
Atomic Collisions in Solids ICACS /19./
Event type
K - Konference
Event date
29.07.2001-03.08.2001
VEvent location
Paris
Country
FR - France
Event type
WRD
Language
eng - English
Country
NL - Netherlands
Keywords
sputtering ; molecular electronic states ; secondary ion emission
Subject RIV
BM - Solid Matter Physics ; Magnetism
R&D Projects
IAA1067801 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
GA202/99/0881 GA ČR - Czech Science Foundation (CSF)
CEZ
AV0Z2067918 - URE-Y
Annotation
Sputtering of monocrystalline CeF3, LaF3 (doped with Eu), CaF2, and CaCeF2 surfaces by Ar.sup.+.sup. ions with impact energies 500 - 5000 eV has been performed. The emission of Ce.sup.+.sup., Ce.sup.++.sup., La.sup.+.sup., La.sup.++.sup., Eu.sup.+.sup., Eu.sup.++.sup., Ca.sup.+.sup., Ca.sup.++.sup., and F.sup.+.sup. has been investigated by a quadrupole SIMS.
