Number of the records: 1  

Combination of Scanning Auger and Very-Low-Energy Electron Microscopy

  1. 1.
    SYSNO ASEP0205126
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleCombination of Scanning Auger and Very-Low-Energy Electron Microscopy
    Author(s) El Gomati, M. M. (GB)
    Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Frank, Luděk (UPT-D) RID, SAI, ORCID
    Source TitleProceedings of the International Centennial Symposium on the Electron / Kirkland A. ; Brown P. D.. - Cambridge : The University Press, 1998 - ISBN 1-86125-051-7
    Pagess. 326-333
    Number of pages8 s.
    ActionElectron - Centennial Symposium
    Event date15.09.1997-17.09.1997
    VEvent locationCambridge
    CountryGB - United Kingdom
    Languageeng - English
    CountryGB - United Kingdom
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    R&D ProjectsGA202/95/0280 GA ČR - Czech Science Foundation (CSF)
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2000

Number of the records: 1  

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