Surface Cleanliness and Electron Backscattering

Number of the records: 1

1.

SYSNO ASEP	0205124
Document Type	A - Abstract
R&D Document Type	The record was not marked in the RIV
R&D Document Type	Není vybrán druh dokumentu
Title	Surface Cleanliness and Electron Backscattering
Author(s)	Steklý, Richard (UPT-D) Zadražil, Martin (UPT-D) El Gomati, M. M. (GB) Frank, Luděk (UPT-D)_{RID, SAI, ORCID} Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID}
Source Title	Book of Abstracts EMAS '99 - 6th European Workshop on Modern Developments and Applications in Microbeam Analysis. - Konstanz : European Microbeam Analysis Society, 1999 s. 344
Number of pages	1 s.
Action	EMAS '99 /6./ - European Workshop on Modern Developments and Applications in Microbeam Analysis
Event date	03.05.1999-07.05.1999
VEvent location	Konstanz
Country	DE - Germany
Language	eng - English
Country	GB - United Kingdom
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
R&D Projects	IPP1067701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2000

Number of the records: 1