Number of the records: 1  

On the measurement of low energy backscattered and secondary electron coefficients

    1.
    SYSNO ASEP0205085
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleOn the measurement of low energy backscattered and secondary electron coefficients
    Author(s) El Gomati, M. M. (GB)
    Assa'd, A. M. D. (GB)
    El Gomati, T. (LY)
    Zadražil, Martin (UPT-D)
    Source TitleElectron Microscopy and Analysis 1997 - Proceedings of the Institute of Physics Conference (Series Number 153, Section 7). - Bristol : Institute of Physics Publishing Ltd., 1997 / Rodenburg J. M. - ISBN 0-7503-0441-3
    Pagess. 265-268
    Number of pages4 s.
    ActionEMAG '97 - Electron Microscopy and Analysis Conference
    Event date02.09.1997-05.09.1997
    VEvent locationCambridge
    CountryGB - United Kingdom
    Languageeng - English
    CountryGB - United Kingdom
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing1999

Number of the records: 1  

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