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Elemental analysis with neutron beams: neutron depth profiling

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    SYSNO ASEP0185810
    Document TypeG - Proceedings (int. conf.)
    R&D Document TypeNení vybrán druh dokumentu
    TitleElemental analysis with neutron beams: neutron depth profiling
    Author(s) Vacík, Jiří (UJF-V) RID, ORCID, SAI
    Červená, Jarmila (UJF-V)
    Hnatowicz, Vladimír (UJF-V) RID
    Naramoto, H. (JP)
    Issue dataTokyo: Japan Electrochemical Society, 2003
    Number of pages6 s.
    ActionRegular Meeting of Japan Electrochemical Society
    Event date07.10.2002
    VEvent locationTokyo
    CountryJP - Japan
    Event typeWRD
    Languageeng - English
    CountryJP - Japan
    KeywordsNDP ; elemental analysis
    Subject RIVBM - Solid Matter Physics ; Magnetism
    CEZAV0Z1048901 - UJF-V
    AnnotationSeveral techniques have been introduced at the intermediate power nuclear research reactors for elemental analysis. One of them was Neutron Depth Profiling (NDP), which provides an isotope specific, nondestructive way for the measurement of concentration versus depth distributions in the near-surface region of solids. The method is applicable to the investigation of profiles of several technologically important elements (particularly He, Li, B). provides an isotope specific, nondestructive way for the measurement of concentration versus depth distributions in the near-surface region of solids. The method is applicable to the investigation of profiles of several technologically important elements (particularly He, Li, B).
    WorkplaceNuclear Physics Institute
    ContactMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
    Year of Publishing2004

Number of the records: 1  

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