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Characterization of Phase Transitions in PZT Ferroelectric films with spectral Ellipsometry

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    SYSNO ASEP0134091
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JOstatní články
    TitleCharacterization of Phase Transitions in PZT Ferroelectric films with spectral Ellipsometry
    Author(s) Deineka, Alexander (FZU-D)
    Suchaneck, G. (DE)
    Jastrabík, Lubomír (FZU-D) RID, ORCID
    Gerlach, G. (DE)
    Source TitleJemná mechanika a optika. - : Fyzikální ústav AV ČR, v. v. i. - ISSN 0447-6441
    11-12, - (2002), s. 377-380
    Number of pages4 s.
    Languageeng - English
    CountryCZ - Czech Republic
    Keywordsferroelectric film ; phase transition ; film profile
    Subject RIVBH - Optics, Masers, Lasers
    R&D ProjectsLN00A015 GA MŠk - Ministry of Education, Youth and Sports (MEYS)
    GA202/00/1425 GA ČR - Czech Science Foundation (CSF)
    CEZAV0Z1010921 - FZU-D
    AnnotationIn this work, high temperature ellipsometric investigations of the PbZr0.235Ti0.765O3(PTZ) films prepared with different techniques are summarized with regard to recently obtained phase transitons at elevated temperatures belw the Curie point. The temperature dependences of the refractive index at fixed wavelenghts, refractive index profiles, and temperature dependence of optical gapare described.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2003

Number of the records: 1