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Characterization of Phase Transitions in PZT Ferroelectric films with spectral Ellipsometry
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SYSNO ASEP 0134091 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Ostatní články Title Characterization of Phase Transitions in PZT Ferroelectric films with spectral Ellipsometry Author(s) Deineka, Alexander (FZU-D)
Suchaneck, G. (DE)
Jastrabík, Lubomír (FZU-D) RID, ORCID
Gerlach, G. (DE)Source Title Jemná mechanika a optika. - : Fyzikální ústav AV ČR, v. v. i. - ISSN 0447-6441
11-12, - (2002), s. 377-380Number of pages 4 s. Language eng - English Country CZ - Czech Republic Keywords ferroelectric film ; phase transition ; film profile Subject RIV BH - Optics, Masers, Lasers R&D Projects LN00A015 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) GA202/00/1425 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z1010921 - FZU-D Annotation In this work, high temperature ellipsometric investigations of the PbZr0.235Ti0.765O3(PTZ) films prepared with different techniques are summarized with regard to recently obtained phase transitons at elevated temperatures belw the Curie point. The temperature dependences of the refractive index at fixed wavelenghts, refractive index profiles, and temperature dependence of optical gapare described. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2003
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