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Electron yield from Be-Cu induced by highly charged Xe q+ ions
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SYSNO ASEP 0133977 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Ostatní články Title Electron yield from Be-Cu induced by highly charged Xe q+ ions Author(s) Krása, Josef (FZU-D) RID, ORCID
Láska, Leoš (FZU-D)
Stöckli, M. P. (US)
Fehrenbach, C. W. (US)Source Title Nuclear Instruments & Methods in Physics Research Section B. - : Elsevier - ISSN 0168-583X
Roč. 196, - (2002), s. 61-67Number of pages 7 s. Language eng - English Country NL - Netherlands Keywords highly charged ion-induced electron emission ; angle impact effect ; Be-Cu Subject RIV BH - Optics, Masers, Lasers R&D Projects IAA1010105 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) LN00A100 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z1010921 - FZU-D Annotation The total electron yield, gamma, for emission of electrons induced by impact of Xeq+ (8óqó28) ions with kinetic energy per charge Ei/q from 5 to 150keV/q on clean Be-Cu is presented for the impact angle, é, ranging from 0o to 60o.The é-dependences are analyzed with the use of the relation, which can distinguish above- and below-surface electron emission. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2003
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