Number of the records: 1
Ellipsometry and LIMM investigations of the interaction between PZT thin films and platinum electrodes and air
- 1.
SYSNO ASEP 0133423 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Ostatní články Title Ellipsometry and LIMM investigations of the interaction between PZT thin films and platinum electrodes and air Author(s) Deineka, Alexander (FZU-D)
Glinchuk, M. D. (UA)
Jastrabík, Lubomír (FZU-D) RID, ORCID
Suchaneck, G. (DE)
Sandner, T. (DE)
Gerlach, G. (DE)Source Title Ferroelectrics. - : Taylor & Francis - ISSN 0015-0193
Roč. 254, - (2001), s. 205-211Number of pages 7 s. Language eng - English Country GB - United Kingdom Keywords ferroelecric film ; depth profile ; interface interaction Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects GA202/00/1425 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z1010914 - FZU-D Annotation In this work we present new results of investigation of PbZr0.235Ti0.765O3 (PTZ) films deposited onto Si/SiO2/adhesion layer/(111) Pt substrate by RF sputtering. Optical constants of PZT films, refraction index depth profile and polarization profile were determined. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2002
Number of the records: 1